The Model SKP470 Scanning Kelvin Probe operates using a vibrating capacitance probe and through a swept backing potential, the work function difference is measured between the scanned probe reference tip and sample surface.
A surface work function can be directly correlated to many aspects of surface condition including corrosion potential. Moreover, as the technique utilises a capacitance probe, such measurements can be made on surfaces in gaseous atmospheric conditions or even under insulating coatings.
The capacitance probe may also be used in height tracking mode to maintain a constant height between the probe tip and sample surface, allowing measurements to be made over uneven surfaces.
The SKP470 is the very latest development in Kelvin Probe technology incorporating many new features affording the user performance, flexibility and ease of use.
Vibration amplitude (±10%): Software set from 0 – 30 µm perpendicular to sample surface.
Backing potential controller
Probe type: SKPR Tungsten air gap.
Electrochemical sensitivity: Better than 0.15 meV.
Positioning system specifications
Piezoelectric element (for z axis only)